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Atomic structure of YB56 studied by digital high-resolution electron microscopy and electron diffraction

Published online by Cambridge University Press:  31 January 2011

Takeo Oku ,
Jan-Olov Bovin ,
Iwami Higashi ,
Takaho Tanaka  and
Yoshio Ishizawa
Takeo Oku*
Affiliation:
Institute of Scientific and Industrial Research, Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan
Jan-Olov Bovin
Affiliation:
National Center for HREM, Inorganic Chemistry 2, Chemical Center, Lund University, P.O. Box 124, S-221 00 Lund, Sweden
Iwami Higashi
Affiliation:
Department of Chemistry, Chiba Institute of Technology, Narashino, Chiba 275-0016, Japan
Takaho Tanaka
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba, Ibaraki 305-0044, Japan
Yoshio Ishizawa
Affiliation:
Iwaki Meisei University, Iwaki, Fukushima 970–8551, Japan
*
a)Address all correspondence to this author. e-mail: yunkui li@hotmail.com
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Abstract

Atomic positions for Y atoms were determined by using high-resolution electron microscopy and electron diffraction. A slow-scan charge-coupled device camera which had high linearity and electron sensitivity was used to record high-resolution images and electron diffraction patterns digitally. Crystallographic image processing was applied for image analysis, which provided more accurate, averaged Y atom positions. In addition, atomic disordering positions in YB56 were detected from the differential images between observed and simulated images based on x-ray data, which were B24 clusters around the Y-holes. The present work indicates that the structure analysis combined with digital high-resolution electron microscopy, electron diffraction, and differential images is useful for the evaluation of atomic positions and disordering in the boron-based crystals.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 1 , January 2001 , pp. 101 - 107
Copyright
Copyright © Materials Research Society 2001

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