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Annealing effect on in-plane alignment and surface morphology of epitaxial Bi4Ti3O12 thin films prepared by the chemical solution deposition

Published online by Cambridge University Press:  31 January 2011

K. Hwang  and
Y. Park
K. Hwang
Affiliation:
School of Automotive & Mechanical Engineering, Nambu University, 864–1 Wolgye-dong, Kwangsan-gu, Kwangju 506–302, Republic of Korea
Y. Park
Affiliation:
Department of Dental Materials & Dental Materials Research Institute, School of Dentistry, Chonnam National University, 5 Hak 1 dong, Dong-gu, Kwangju 501–190, Republic of Korea
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Abstract

Bi4Ti3O12 thin films were grown epitaxially on SrTiO3(100) substrates by chemical solution deposition using metal naphthenates as starting materials. Homogeneous Bi–Ti solution with toluene was spin-coated onto the substrates and pyrolyzed at 500 °C for 10 min in air. Highly c-axis-oriented Bi4Ti3O12 thin films were crystallized by annealing pyrolyzed films at ≥650 °C. The x-ray pole-figure analysis indicated that the Bi4Ti3O12 thin films have an epitaxial relationship with the SrTiO3(100) substrates. The surface morphology of the films annealed at lower temperature, i.e., 650 °C, exhibited flat and smooth surfaces, while films annealed at higher temperatures, i.e., 750 and 800 °C, were characterized by three-dimensional outgrowth.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 9 , September 2001 , pp. 2519 - 2525
Copyright
Copyright © Materials Research Society 2001

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