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A time-resolved x-ray diffraction study of Ti5Si3 product formation during combustion synthesis

Published online by Cambridge University Press:  31 January 2011

C. R. Kachelmyer ,
I. O. Khomenko ,
A. S. Rogachev  and
A. Varma
C. R. Kachelmyer
Affiliation:
Department of Chemical Engineering, University of Notre Dame, Notre Dame, Indiana 46556
I. O. Khomenko
Affiliation:
Institute of Structural Macrokinetics, Russian Academy of Science, Chernogolovka, 142 432 Russia
A. S. Rogachev
Affiliation:
Institute of Structural Macrokinetics, Russian Academy of Science, Chernogolovka, 142 432 Russia
A. Varma*
Affiliation:
Department of Chemical Engineering, University of Notre Dame, Notre Dame, Indiana 46556
*
a)Author to whom correspondence should be addressed.
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Abstract

Time-resolved x-ray diffraction (TRXRD) was performed during Ti5Si3 synthesis by the self-propagating high-temperature synthesis mode for different Ti size fractions. It was determined that the time for product formation (ca. 15 s) was independent of Ti particle size. However, the formation of Ti5Si4 phase occurred when relatively large titanium particles were used. A simultaneous measurement of the temperature and TRXRD allowed us to attribute the shifting of XRD peaks at high temperature to thermal expansion of the Ti5Si3 product. The thermal expansion coefficients differ for different crystal planes, and their numerical values compare well with those reported previously in the literature.

Type
Articles
Information
Journal of Materials Research , Volume 12 , Issue 12 , December 1997 , pp. 3230 - 3240
Copyright
Copyright © Materials Research Society 1997

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