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Doped polyaniline polymer fuses: Electrically programmable read-only-memory elements

Published online by Cambridge University Press:  03 March 2011

Albert W. Marsman ,
Cees M. Hart ,
Gerwin H. Gelinck ,
Tom C.T. Geuns  and
Dagobert M. de Leeuw
Albert W. Marsman*
Affiliation:
Philips Research Laboratories, 5656 AA Eindhoven, The Netherlands
Cees M. Hart
Affiliation:
Philips Research Laboratories, 5656 AA Eindhoven, The Netherlands
Gerwin H. Gelinck
Affiliation:
Philips Research Laboratories, 5656 AA Eindhoven, The Netherlands
Tom C.T. Geuns
Affiliation:
Philips Research Laboratories, 5656 AA Eindhoven, The Netherlands
Dagobert M. de Leeuw
Affiliation:
Philips Research Laboratories, 5656 AA Eindhoven, The Netherlands
*
a) Address all correspondence to this author. e-mail: alwin.marsman@philips.com
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Abstract

We demonstrate polymeric electrically programmable read-only-memory elements based on camphorsulfonic-acid–doped polyaniline lines. Their working mechanism relies on irreversible reduction of the electrical conductivity by Joule heating like electrical safety fuses. The heating power is supplied electrically. The critical power required to “blow up” the fuse is strongly reduced by notches. The influence of the notch design can be predicted reasonably well using a simple thermal model. The critical power becomes less than 1 mW for fuses with notches narrower than 2 μm. This power can be delivered by organic transistors already at modest voltages, opening the way of integration of these memory elements in all-polymer circuits.

Keywords

Electrical propertiesPolymer

Information

Type
Articles—Organic Electronics Special Section
Information
Journal of Materials Research , Volume 19 , Issue 7 , July 2004 , pp. 2057 - 2060
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1.Brown, A.R., Pomp, A., Hart, C.M. and de Leeuw, D.M.: Science 270, 972 (1995).CrossRefGoogle Scholar
2.Drury, C.J., Mutsaers, C.M.J., Hart, C.M., Matters, M. and de Leeuw, D.M.: Appl. Phys. Lett. 73, 108 (1998).CrossRefGoogle Scholar
3.Gelinck, G.H., Geuns, T.C.T. and de Leeuw, D.M.: Appl. Phys. Lett. 77, 1487 (2000).CrossRefGoogle Scholar
4.Touwslager, F.J., Willard, N.P. and de Leeuw, D.M.: Appl. Phys. Lett. 81, 4556 (2002).CrossRefGoogle Scholar
5.Touwslager, F.J., Willard, N.P. and de Leeuw, D.M.: Synth. Met. 135, 53 (2003).CrossRefGoogle Scholar
6.Halik, M., Klauk, H., Zschieschang, U., Kriem, T., Schmidt, G., Radlik, W. and Wussow, K.: Appl. Phys. Lett. 81, 289 (2002).CrossRefGoogle Scholar
7.Holman, J.P.Heat transfer, 8th ed. (McGraw-Hill, Inc. 1997).Google Scholar