Hostname: page-component-7dd5485656-wjfd9 Total loading time: 0 Render date: 2025-10-31T05:39:48.507Z Has data issue: false hasContentIssue false
  • English
  • Français

Analysis of pore structure of activated carbon fibers using high resolution transmission electron microscopy and image processing

Published online by Cambridge University Press:  03 March 2011

K. Oshida ,
K. Kogiso ,
K. Matsubayashi ,
K. Takeuchi ,
S. Kobayashi ,
M. Endo ,
M.S. Dresselhaus  and
G. Dresselhaus
K. Oshida*
Affiliation:
Faculty of Engineering, Shinshu University, 500 Wakasato, Nagano 380, Japan
K. Kogiso
Affiliation:
Faculty of Engineering, Shinshu University, 500 Wakasato, Nagano 380, Japan
K. Matsubayashi
Affiliation:
Faculty of Engineering, Shinshu University, 500 Wakasato, Nagano 380, Japan
K. Takeuchi
Affiliation:
Faculty of Engineering, Shinshu University, 500 Wakasato, Nagano 380, Japan
S. Kobayashi*
Affiliation:
Faculty of Engineering, Shinshu University, 500 Wakasato, Nagano 380, Japan
M. Endo
Affiliation:
Faculty of Engineering and Cooperative Research Center, Shinshu University, 500 Wakasato, Nagano 380, Japan
M.S. Dresselhaus
Affiliation:
Department of Electrical Engineering and Computer Science, and Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 01239
G. Dresselhaus
Affiliation:
Francis Bitter National Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 01239
*
a)Permanent address: Nagano National College of Technology, 713 Tokuma, Nagano 381, Japan.
b)Permanent address: Nagano Japan Radio Cooperation, 1163 Inasato, Nagano 380, Japan.
Get access

Abstract

Activated carbon fibers (ACF's), already used widely as absorbent materials, are now expected to be useful as new electrical and electronic materials, for their very large specific surface areas (SSA). Chemical adsorption as well as x-ray diffraction have been mainly used for characterizing the ACF structure. While TEM observations reveal the texture of ACF's, such observations have not yet yielded quantitative information about the microstructure. To promote the quantitative interpretation of the TEM images, computer image analysis is used in this work to clarify the pore structure of ACF's. The microstructures of three samples, which are all isotropic pitch-based ACF's but with different SSA values, have been investigated. Operations such as noise reduction, low frequency cut-off filtering, and binary image formation are used to clarify the pore images of the ACF's. The distribution of the ACF porosity size is clearly shown by a frequency analysis of the two-dimensional fast Fourier transform (FFT). The results suggest that TEM images include contributions from many different pore sizes. Pores in different size ranges are extracted by the inverse FFT (IFFT) operation by selecting the specific frequency range, and by-this analysis the pore structure is shown to have fractal characteristics.

Information

Type
Articles
Information
Journal of Materials Research , Volume 10 , Issue 10 , October 1995 , pp. 2507 - 2517
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1Endo, M., Okada, Y., and Nakamura, H., Synth. Metals 34, 739 (1989).Google Scholar
2Tanahashi, I., Yoshida, A., and Nishina, A., Carbon 28, 477 (1990).CrossRefGoogle Scholar
3Fung, A. W. P., Dresselhaus, M. S., and Endo, M., Phys. Rev. B 48, 14953 (1993).Google Scholar
4divittorio, S.L., Dresselhaus, M. S., Endo, M., Issi, J-P., Piraux, L., and Bayot, V., J. Mater. Res. 6, 778 (1991).CrossRefGoogle Scholar
5Rao, A. M., Fung, A. W. P., di Vittorio, S.L., Dresselhaus, M. S., Dresselhaus, G., Endo, M., Oshida, K., and Nakajima, T., Phys. Rev. B 45, 6883 (1992).Google Scholar
6Kaneko, K., Ishii, C., Ruike, M., and Kuwabara, H., Carbon 30, 1075 (1992).CrossRefGoogle Scholar
7Oshida, K., Endo, M., Nakajima, T., di Vittorio, S.L., Dresselhaus, M. S., and Dresselhaus, G., J. Mater. Res. 8, 512 (1993).CrossRefGoogle Scholar
8Endo, M., Oshida, K., Takeuchi, K., Sasuda, Y., Matsubayashi, K., and Dresselhaus, M.S., Trans. IEICE Jpn. J77-(C-II, 139 (1994, in Japanese).Google Scholar
9Fryer, J. R., Carbon 19, 431 (1981).Google Scholar
10Huttepain, M. and Oberlin, A., Carbon 28, 103 (1990).Google Scholar
11Chevalier, J-P., Colliex, C., and Tence, M., J. Microsc. Spectrosc. Electron 10, 417 (1985).Google Scholar
12Tence, M., Chevalier, J-P., and Jullien, R., J. Physique 47, 1989 (1986).Google Scholar
13Samson, R. J., Mulholland, G. W., and Gentry, J. W., Langmuir 3, 272 (1987).CrossRefGoogle Scholar
14Sinha, S. K., Physica D 38, 310 (1989).Google Scholar
15Salome, L. and Carmona, F., Carbon 29, 599 (1991).Google Scholar
16Mandelbrot, B. B., The Fractal Geometry of Nature (Freedman, San Francisco, CA, 1982).Google Scholar
17Pfeifer, P. and Avnir, D., J. Chem. Phys. 79, 3558 (1983).CrossRefGoogle Scholar
18Avnir, D., Farin, D., and Pfeifer, P., J. Chem. Phys. 79, 3566 (1983).CrossRefGoogle Scholar
19McEnaney, B., Carbon 26, 267 (1988).CrossRefGoogle Scholar