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Young's Modulus Measurement of Chromium Electroplating

Published online by Cambridge University Press:  06 March 2019

Masaaki Ohtsuka ,
Hideaki Hatsuok ,
Yukio Hirose  and
Hitoshi Ishii
Masaaki Ohtsuka
Affiliation:
Musashi Seimitsu Industry Co., Ltd. 39-5 Daizen, Ueta, Toyohashi, 441 Japan
Hideaki Hatsuok
Affiliation:
Musashi Seimitsu Industry Co., Ltd. 39-5 Daizen, Ueta, Toyohashi, 441 Japan
Yukio Hirose
Affiliation:
Department of Materials Science, Kanazawa University 1-1 Marunouchi, Kanazawa, 920 Japan
Hitoshi Ishii
Affiliation:
Department of Materials Engineering, Shizuoka University 3-5-1 Jyouhoku, Hamamatsu, 432 Japan
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Extract

The electroplating of Cr has been an important industrial process for cutting tools, press machines and molds for casting. In spite of these, quite a few problems remain unsolved regarding the basic property. It is important to know the mechanical characteristics of Cr electroplated layers.

In the present paper, the first part deals with the measurement of mechanical Young's modulus of Cr electroplated layers. The X-ray method was successfully applied to measure the X-ray Young's modulus and the residual stress on the Cr electroplated surface layer.

Information

Type
VII. Stress Determination by Diffraction Methods
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 527 - 535
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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