Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Fox, Alan G.
and
Cannon, Rowland M.
1989.
X-Ray Diffraction and TEM Studies of the Delamination of Copper Thin Films from Glass and Silica Substrates.
MRS Proceedings,
Vol. 167,
Issue. ,
Funaki, Katsuyuki
Nanayama, Yukio
Ichimaru, Yoshiji
Hirose, Yukio
and
Tanaka, Keisuke
1990.
X-ray Study on Fatigue Fracture Surfaces of Aluminum Alloy Reinforced with Silicon Carbide Whiskers.
Advances in X-ray Analysis,
Vol. 34,
Issue. ,
p.
651.