Hostname: page-component-cb9f654ff-mwwwr Total loading time: 0 Render date: 2025-08-28T01:32:39.193Z Has data issue: false hasContentIssue false
  • English
  • Français

Thin-Film X-Ray Spectroscopy

Published online by Cambridge University Press:  06 March 2019

J.J. Finnegan
J.J. Finnegan*
Affiliation:
U.S. Army Signal Research and Development Laboratory Fort Monmouth, New Jersey
Get access

Abstract

Quantitative de terminations of thickness and composition are presented for 100- to 10,000-A iron-nickel films. Calibration of X-ray intensities with interferometric and calorimetric values give linear plots for films deposited on Mylar or glass substrates. Application of a film-casting technique shows promise of alleviating two of the problems encountered in X-ray spectroscopy, i.e., matrix-effect-caused deviations from proportionality and the lack of standards for calibration of many types of material.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 500 - 511
Copyright
Copyright © International Centre for Diffraction Data 1961

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Tolansky, S., Multiple-Beam Interferometry of Surfaces and Films, Oxford University Press, London, 1949.Google Scholar
2.The Preparation and Characteristics of Thin Ferromagnetic Films, Final Eng. Report, Contract AF 19(604) 2659, Appendix A, Remington Rand Univac, November 1958.Google Scholar
3. Loomis, T. C., “Analysis of Thin Films of Iron-Nickel Alloys on Glass,” 9th Annual Symposium on Spectroscopy, Chicago, 111., June 1958.Google Scholar
4. Month, A., Schindler, M., and Antales, J., “Measurement of Composition and Thickness of Iron-Nickel Films by X-Ray Fluorescence Techniques,” Pittsburgh Conference of Analytical Chemistry and Applied Spectroscopy, February-March 1961.Google Scholar
5. Felten, E. G., Fankuchen, Isidor, and Steigman, Joseph, “A Possible Solution of the Matrix Problem in X-Ray Fluorescence Spectroscopy,” Anal. Chem, Vol. 31, 1959, p. 1771.Google Scholar
6. Gunn, E. L., “X-Ray Fluorescent Intensity of Elements Evaporated from Solution onto Thin Film,” Anal. Chem., Vol. 33, 1961, p. 921.Google Scholar
7. Pfeiffer, H. G. and Zemany, P. D., “Trace Analysis by X-Ray Emission Spectroscopy,” Nature, Vol. 174, 1954, p. 397.Google Scholar
8. Rhodin, T. N.. “Chemical Analysis of Thin Films by X-Ray Emission Spectrography,” Anal. Chem., Vol. 27, 1955, p. 1857.Google Scholar
9. Salmon, M. L., “Recent Developments in Fluorescent X-Ray Spectrographic-Absorptiometric Analyses of Mineral Systems,” Vol. 2, Advances in X-Ray Analysis, University of Denver, Plenum Press, 1958, p, 303.Google Scholar