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Synchrotron Radiation X-Ray Fluorescence Analysis with a Crystal Spectrometer

Published online by Cambridge University Press:  06 March 2019

Kazutaka Ohashi ,
Mamoru Takahashl ,
Yohichi Gohshi ,
Atsuo Iida  and
Shunji Eishimoto
Kazutaka Ohashi
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering The University of Tokyo, Hongo, Bunkyoku, Tokyo 113, JAPAN
Mamoru Takahashl
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering The University of Tokyo, Hongo, Bunkyoku, Tokyo 113, JAPAN
Yohichi Gohshi
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering The University of Tokyo, Hongo, Bunkyoku, Tokyo 113, JAPAN
Atsuo Iida
Affiliation:
Photon Factory, National Laboratory for High Energy Physics 0-ho, Tsukubashi, Ibaraki 305, JAPAN
Shunji Eishimoto
Affiliation:
Photon Factory, National Laboratory for High Energy Physics 0-ho, Tsukubashi, Ibaraki 305, JAPAN
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Abstract

A wavelength dispersive spectrometer which consists of a flat crystal analyser and a position sensitive proportional counter has been developed for X-ray fluorescence analysis using synchrotron radiation. The advantages of this spectrometer are high energy resolution, multielemental nature, and high efficiency, and these match well "with the high brightness synchrotron X-ray source. The minimum detection limits are of the order of ppm or pg. An application to elemental mapping has also been demonstrated. The present system is useful for practical analysis of small samples or small regions.

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