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Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter

Published online by Cambridge University Press:  06 March 2019

Yasuo Yoshioka ,
Ken-ichi Hasegawa  and
Koh-ichi Mochiki
Yasuo Yoshioka
Affiliation:
Musashi Institute of Technology 1, Tamazutsumi, Setagaya, Tokyo 158, Japan
Ken-ichi Hasegawa
Affiliation:
Faculty of Engineering, University of Tokyo 7, Hongoh, Bunkyo, Tokyo 113, Japan
Koh-ichi Mochiki
Affiliation:
Faculty of Engineering, University of Tokyo 7, Hongoh, Bunkyo, Tokyo 113, Japan
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Abstract

A position-sensitive proportional counter suitable for the X-ray stress measurement has been developed and residual stresses were measured with an apparatus that uses this PSD system. The counter was designed to have a good angular resolution over the counter length for the diffracted X-ray beam and high counting rates. The mean angular resolution measured was about 0.2° in 2θ (FWHM) at 200 mm, and the maximum allowable counting rate reached about 40,000 cps.

The time required for the data accumulation was shown to be 1/10 to 1/30 of the time required with a standard diffractometer.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 22: Twenty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-4, 1978 , 1978 , pp. 233 - 240
Copyright
Copyright © International Centre for Diffraction Data 1978

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References

1. James, M. R. and Cohen, J. B., “The Applications of a Position Sensitive Detector to the Measurement of Residual Stresses,” Advances in X-Ray Analysis, Vol. 19, p. 695 (1975).Google Scholar
2. Alberi, J., Fischer, J., Radeka, V., Rogers, L. C. and Schoenborn, B., “A Two-Dimensional Position-Sensitive Detector for Thermal Neutrons,” Nuclear Instruments and Methods, Vol. 127, p. 507 (1975).Google Scholar
3. Yoshioka, Y., “A Method of Data Acquisition for X—Ray Stress Measurement,” J. JSMS, Vol. 23, p. 15 (1974).Google Scholar