Hostname: page-component-cb9f654ff-h4f6x Total loading time: 0 Render date: 2025-08-23T17:18:24.995Z Has data issue: false hasContentIssue false
  • English
  • Français

A Rapid and Precise Computer Method for Qualitative X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

T. C. Huang ,
W. Parrish  and
G. L. Ayers
T. C. Huang
Affiliation:
IBM Research Laboratory, 5600 Cottle Road, San Jose, CA. 95193
W. Parrish
Affiliation:
IBM Research Laboratory, 5600 Cottle Road, San Jose, CA. 95193
G. L. Ayers
Affiliation:
IBM Research Laboratory, 5600 Cottle Road, San Jose, CA. 95193
Get access

Abstract

This paper describes a computer method for wavelength dispersive (WD) qualitative X-ray fluorescence (XRF) analysis. It determines the elements, spectral lines, wavelengths, reflection angles and peak intensities of the first and second order reflections in less than half a minute of time using an IBM Series/1 minicomputer. The resolution and precision are significantly better than the energy dispersive (ED) method and when combined with high speed computer recording the speed is comparable.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 407 - 412
Copyright
Copyright © International Centre for Diffraction Data 1980

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Ayers, G. L., Huang, T. C. and Parrish, W., High Speed X-Ray Analysis, J. Appl. Cryst. 11:229 (1978).Google Scholar
2. Parrish, W., Huang, T. C. and Ayers, G. L., Comparison of Peak Search and Profile Fitting Methods in X-Ray Powder Diffractometry, American Crystallographic Association Meeting, Eufaula, Alabama (1980).Google Scholar
3. Savitsky, A. and Golay, M. J. E., Smoothing and Differentiation Data by Simplified Least Squares Procedures, Anal. Chem, 36:1627 (1964).Google Scholar
4. Parrish, W., Ayers, G. L. and Huang, T. C., A Minicomputer and Methodology for X-Ray Analysis, Adv. X-Ray Anal, 23:313 (1980).Google Scholar
5. Laguitton, D. and Mantler, M., LAMA 1 - A General Fortran program for Quantitative X-Ray Fluorescence Analysis, Adv. X-Ray Anal. 20:515 (1977).Google Scholar
6. Laguitton, D. and Parrish, W., Simultaneous Determination of Composition and Mass-Thickness of Thin Films by Quantitative X-Ray Fluorescence Analysis, Anal. Chem. 49:1152 (1977),Google Scholar
7. Huang, T. C., Quantitative X-Ray Fluorescence Analysis of Thin Films Using LAMA-2, to be published in X-Ray Spectrometry.Google Scholar