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Particle Statistics and Whole-Pattern Methods in Quantitative X-Ray Powder Diffraction Analysis

Published online by Cambridge University Press:  06 March 2019

Deane K. Smith
Deane K. Smith*
Affiliation:
Department of Geosciences Materials Research Laboratory The Pennsylvania State University University Park, PA 16802, USA
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Abstract

Modern powder diffraction employing computer-controlled diffractometers now allows quantitative analytical methods to use the whole diffraction trace rather then only individual peaks. Two such methods are in common use the Rietveld method which refines the crystal structures of the component phases as part of the matching calculation, and the patternfitting method which uses reference patterns from a database. Potential accuracies of these methods seems to be around 1 % absolute. The most severe limitation on the potential accuracy of these methods is particle statistics, which has been reviewed in considerable detail.

Information

Type
I. Whole Pattern Fitting, Rietveld Analysis and Calculated Diffraction Patterns
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 1 - 15
Copyright
Copyright © International Centre for Diffraction Data 1991

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