An adapter for a standard Norelco spectrographte attachment will be described which permits the examination of a selected area of the specimen by X-ray fluorescence analysis. The size of the area can be varied depending upon the choice of pinholes with sizes available dovwi to 0.010 in. or 250μ. The sample is placed into a specially modified sample holder so that it can be moved at orthogonal directions under the beam from outside the spectrograph while the sample is under X-ray irradiation. Dam on applications will also be given.