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The Measurement of Elastic Constants for the Determination of Stresses by X-Rays

Published online by Cambridge University Press:  06 March 2019

K. Perry ,
I.C. Noyan ,
P.J. Rudnik  and
J.B. Cohen
K. Perry
Affiliation:
Department of Materials Science, The Technological Institute, Northwestern University, Evanston, Illinois,60201
I.C. Noyan
Affiliation:
Department of Materials Science, The Technological Institute, Northwestern University, Evanston, Illinois,60201
P.J. Rudnik
Affiliation:
Department of Materials Science, The Technological Institute, Northwestern University, Evanston, Illinois,60201
J.B. Cohen
Affiliation:
Department of Materials Science, The Technological Institute, Northwestern University, Evanston, Illinois,60201
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Residual and applied stresses (σij) are often measured via X-ray diffraction, by calculating the resultant elastic strains (ϵij) from the measured change in interplanar spacing (“d”). This method is non-destructive, reasonably reproducible (typically ±14 MPa), can be carried out in the field, and is readily automated to give values to an operator-specified precision , Let Li represent the axes of the measuring system with L3 normal to the diffracting planes, and Pi represent the sample axes. These axes are illustrated in Figure 1. In what follows, primed stresses and strains are in the laboratory system, while unprimed values are in the sample system.

Information

Type
II. X-Ray Strain and Stress Determination
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 159 - 170
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

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