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Glass and Glass Raw Materials Analysis using a Philips PW1600 Wavelength Dispersive X-Ray Spectrometer

Published online by Cambridge University Press:  06 March 2019

D. R. Jones IV  and
G. D. Bowling
D. R. Jones IV
Affiliation:
Owens-Corning Fiberglas Corp., Granville, Ohio 43023
G. D. Bowling
Affiliation:
Owens-Corning Fiberglas Corp., Granville, Ohio 43023
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Extract

The Inorganic Analytical Laboratory of Owens-Corning Fiberglas is routinely using a Philips PW1600 x-ray spectrometer for the analysis of glass and glass raw materials. The spectrometer is equipped with 11 fixed channels, two scanning channels, and an energy dispersive detector. Operation of the spectrometer and data compilation is accomplished using a Digital Equipment Corp. PDP11/34 computer. The x-ray is controlled by an RSX-11M operating system, and the Philips “Alphas” software package is used to process data using the Lucas- Tooth Pyne (LP), Lachance-Traill (LT), or Rasberry-Heinrich (RH) correction models.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 399 - 400
Copyright
Copyright © International Centre for Diffraction Data 1980

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