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A Dual Detector Diffractometer for Measurement of Residual Stress

Published online by Cambridge University Press:  06 March 2019

C. M. Mitchell
C. M. Mitchell*
Affiliation:
Physical Metallurgy Research Laboratories CAHMET, Department of Energy, Mines and Resources, Ottawa
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Abstract

The diffractometer employs dual fixed detectors and a moving, vertically mounted X-ray tube. Lattice strain is measured in two specimen directions simultaneously. The drive has three concentric shafts; the outer driven by a cone drive worm and gear; a middle fixed shaft supporting the detectors and an inner shaft geared in a 1:2 ratio carrying the specimen mount. Scanning angles are measured to an accuracy of ±0.001°. A large range of specimen sizes can be accommodated.

Information

Type
X-Ray Diffraction Stress Analysis
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 379 - 391
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

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4. Stokes, A. R., “Fourier Analysis for the Correction of Width and Shapes of Diffraction Lines”, Phys. Soc., London, 61, 328 (1948).Google Scholar
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