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Correction of X-ray Diffraction Profiles Measured by PSPC System

Published online by Cambridge University Press:  06 March 2019

Shin'ichi Ohya  and
Yasuo Yoshioka
Shin'ichi Ohya
Affiliation:
Musashi Institute of Technology 1-28 Tamaautsuml, Setagaya, Tokyo 158, Japan
Yasuo Yoshioka
Affiliation:
Musashi Institute of Technology 1-28 Tamaautsuml, Setagaya, Tokyo 158, Japan
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When an x-ray diffraction profile Is measured for stress analysis or profile analysis by the use of a linear (straight line) position sensitive proportional counter (PSPC) , a convex-type background line is obtained because of the geometrical problem and the absorption of x-rays. Such phenomenon is remarkable when a wide angular range is set on a linear PSPC and it is, in particular, necessary to correct with a straight background for accurate measurement of diffraction angle or half-value breadth of the broadened diffraction profile.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 397 - 402
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

1. Yoshiokaa, Y. et al, X-Ray Stress Measurement by Use of Synchrotron Radiation Source, J. JSMS, 35: 755 (1986).(in Japanese)Google Scholar
2. Savitsky, A. and Golay, M. J. E., Smoothing and Differentiation of Data by Simplified Least Squares Procedures, Analytical Chemistry, 36: 1627 (1964).Google Scholar