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Complicated Average Stress-Fields and Attempts at Their Evaluation With X-Ray Diffraction Methods

Published online by Cambridge University Press:  06 March 2019

H. Ruppersberg
H. Ruppersberg*
Affiliation:
F.B. Werkstoffwissenschaften und Fertigungstechnik Universität des Saarlandes Postfach 11 50 D-66041 Saarbrūcken, Germany
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Abstract

Conventional X-ray stress analysis is based on the so called "linear sin2ψ" law and yields average two axial stresses in the irradiated surface layer of polycrystalline specimens. Three examples are given in this paper where either strong deviations from the linear law are observed due to stress gradients or where the linear law yields wrong results because of three axial stresses. Special experimental techniques are described and formalisms are given for the evaluation of the corresponding stress fields which are in the described cases more complicated than usual.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 235 - 244
Copyright
Copyright © International Centre for Diffraction Data 1993

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