Hostname: page-component-cb9f654ff-mwwwr Total loading time: 0 Render date: 2025-08-25T05:35:19.299Z Has data issue: false hasContentIssue false
  • English
  • Français

A Scheme for Fully Quantitative Energy Dispersive Microprobe Analysis

Published online by Cambridge University Press:  06 March 2019

D.G.W. Smith  and
C.M. Gold
D.G.W. Smith
Affiliation:
Department of Geology, University of Alberta Edmonton, Alberta, Canada T6G 2E3
C.M. Gold
Affiliation:
Department of Geology, University of Alberta Edmonton, Alberta, Canada T6G 2E3
Get access

Abstract

A procedure and program are described for rapid, economical and simple production of fully quantitative, multi-element analyses from energy dispersive microprobe data. Methods are outlined for background shaping and scaling, comprehensive overlap correction, and adjustment for instrumental drift. Program facilities include the output of all coefficients required, built-in standard data, the option to use default standards when no working standards have been measured, and the ability to respecify standards during data processing.

Information

Type
Mathematical Correction Procedures for X-Ray Spectrochemical Analysis
Information
Advances in X-Ray Analysis , Volume 19: Twenty-Fourth Annual Conference on Applications of X-ray Analysis, August 6-8, 1975 , 1975 , pp. 191 - 201
Copyright
Copyright © International Centre for Diffraction Data 1975

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Reed, S.J.B. and Ware, N.G., “Quantitative Electron Microprobe Analysis using a Lithium Drifted Silicon Detector”, X-ray Spectrom. 2, 69–74 (1973).Google Scholar
2. Reed, S.J.B. and Ware, N.G., “Escape Peaks and Internal Fluorescence in X-ray Spectra Recorded with Lithium Drifted Silicon Detectors”, J. Phys. E: Sci. Instr. 5, 582–584 (1972).Google Scholar
3. Smith, D.G.W., Gold, C.M. and Tomlinson, D.A., “The Atomic Number Dependence of the X-ray Continuum Intensity and the Practical Calculation of Background in Energy Dispersive Electron Microprobe Analysis”, X-ray Spectrom. 4, 149–156 (1975).Google Scholar
4. Duncumb, P. and Reed, S.J.B., “The Calculation of Stopping Power and Backscatter Effects in Electron Probe Microanalysis”, Mat. Bur. Stand. (U.S.), Spec. Publ. 298 , 133–154 (1968).Google Scholar
5. Philibert, J., “A Method for Calculating the Absorption Correction in Electronprobe Microanalysis”, in Pattee, H.H., Coslett, V.E., and Engstrom, A., Editors, Third International Symposium on X-ray Optics and X-ray Microanalysis, p. 379–392, Academic Press, New York (1963).Google Scholar
6. Reed, S.J.B., “Characteristic Fluorescence Corrections in Electronprobe Microanalysis,” Brit. J. Appl. Phys. 16, 913–926 (1965).Google Scholar
7. Heinrich, K.F.J., “The Absorption Correction Model for Microanalysis”, Proc. Nat. Conf. Electron Microprobe Anal., 2nd, 1967, Pap. Ho. 7 (1967).Google Scholar
8. Springer, G., “Fluorescence by Continuous Radiation in Multi-Element Targets”, in Shinoda, G., Kohra, K. and Ichinokawa, T., Editors, Proc. 6th International Conf. X-ray Optics and Microanalysis, p. 141–146, Univ. Tokyo Press (1972).Google Scholar