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A High Resolution Portable XRF HgI2 Spectrometer for Field Screening of Hazardous Metal Wastes

Published online by Cambridge University Press:  06 March 2019

M. Bernick ,
P. F. Berry ,
G. R. Voots ,
G. Prince ,
J. B. Ashe ,
J. Patel  and
P. Gupta
M. Bernick
Affiliation:
Roy F. Weston, Inc./REAC, Edison, New Jersey, 08837
G. R. Voots
Affiliation:
TN Technologies, Inc. Round Rock, Texas, 78664
G. Prince
Affiliation:
USEPA/Environmental Response Team, Edison, New Jersey, 08837
J. B. Ashe
Affiliation:
Ashe Analytics, Butte, Montana, 59711
P. Gupta
Affiliation:
Roy F. Weston, Inc./REAC, Edison, New Jersey, 08837
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Abstract

The use of a field portable XRF analyzer incorporating a semiconductor, mercuric iodide, energy dispersive spectrometer is described with emphasis on the benefits of high resolution x-ray detection for rapid screening of hazardous metallic wastes. Results are presented of “in-situ” and “prepared sample” soil measurement for different sites to show the potential of Fundamental Parameter analysis to obtain acceptable quality data with minimum calibration effort, obviating the need for site-specific standards.

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References

1. Fribush, H. M. and Fisk, J. F., “Field Analytical Methods for Superfund,” Proceedings of 2nd International Symposium onField Screening Methods for “Hazardous Wastes and Toxic Chemicals, Feb 12-14, 1991, Las Vegas, pp. 25-29. Google Scholar
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