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An X-Ray Spectrometer for Pixel Analysis of Art Objects

Published online by Cambridge University Press:  06 March 2019

M. Mantler ,
M. Schreiner ,
F. Weber ,
R. Ebner  and
F. Mairinger
M. Mantler
Affiliation:
Institute of Applied and Technical Physics Technical University, Vienna, Austria
M. Schreiner
Affiliation:
Institute of Chemistry Academy of Fine Arts, Vienna, Austria
F. Weber
Affiliation:
Institute of Applied and Technical Physics Technical University, Vienna, Austria
R. Ebner
Affiliation:
Institute of Applied and Technical Physics Technical University, Vienna, Austria
F. Mairinger
Affiliation:
Institute of Applied and Technical Physics Technical University, Vienna, Austria
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Abstract

An x-ray spectrometer has been designed for pixel by pixel analysis along lines or across selected areas of paintings and other art-objects. Characteristic technical data are: 0.8mm2 pixel size, 800mm (vert.) by 1000mm (horiz.) by 200mm (perpendicularly to object) motion distances, ±20μm precision in positioning the system, 2x3m maximum object size (mounted vertically); 2.8kW x-ray tube; Si(Li)detector. PC's are used for instrument control and new, complex data evaluation software.

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References

1. Schreiner, M., Mantler, M., Weber, F., Ebner, R., F. Mairinger: Adv. X-ray Analysis vol.35 (1992).Google Scholar
2. Mantler, M.: Analytica Chimica Acta, 188(1986), pp.25 Google Scholar
3. Mantler, M.: Adv. X-ray Analysis, vol.27 (1984),pp 433.Google Scholar