Hostname: page-component-745bb68f8f-hvd4g Total loading time: 0 Render date: 2025-01-12T05:24:58.084Z Has data issue: false hasContentIssue false
  • English
  • Français

In situ TEM nanomechanics

Published online by Cambridge University Press:  13 January 2015

Q. Yu ,
M. Legros  and
A.M. Minor
Q. Yu
Affiliation:
Center of Electron Microscopy and State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, China; qyuzju@gmail.com
M. Legros
Affiliation:
Centre d’Elaboration des Matériaux et d’Etudes Structurales, Centre National de la Recherche Scientifique, France; marc.legros@cemes.fr
A.M. Minor
Affiliation:
Department of Materials Science and Engineering, University of California–Berkeley, and Lawrence Berkeley National Laboratory, USA; aminor@berkeley.edu
Get access

Abstract

In situ transmission electron microscopy (TEM) nanomechanical testing has benefited from a number of recent technical developments related to both how deformation is imaged and how deformation is induced and measured inside a TEM instrument. These developments have led to new insights into the deformation mechanisms of a wide range of metals and alloys, as well as measurements of the unusual mechanical properties of small-scale objects such as whiskers and nanocrystals. Herein, we describe this recent progress through selected highlights of recent findings on the dynamic behavior of defects such as dislocations, twins, and grain boundaries.

Keywords

Stress/strain relationshipstrengthductilitydislocationsgrain boundariestransmission microscopy
Type
Research Article
Information
MRS Bulletin , Volume 40 , Issue 1: Frontiers of in situ electron microscopy , January 2015 , pp. 62 - 70
Copyright
Copyright © Materials Research Society 2015 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Wilsdorf, H.G.F., Rev. Sci. Instrum. 29, 323 (1958).Google Scholar
Takeuchi, T., Ikeda, S., Ikeno, S., Furubayashi, E.-I., Jpn. J. Appl. Phys. 12, 142 (1973).Google Scholar
Imura, T., Yukawa, N., Saka, H., Nohara, A., Physical Metallurgy of Reactor Fuel Elements: Proceedings of an International Conference on the Physical Metallurgy of Reactor Fuel Elements, Harris, J.E., Sykes, E.C., Eds. (1975), vol. 8, no. 8280920.Google Scholar
Warren, O.L., Shan, Z.W., Asif, S.A.S., Stach, E.A., Morris, J.W., Minor, A.M., Mater. Today 10, 59 (2007).CrossRefGoogle Scholar
Kraft, O., Gruber, P.A., Mönig, R., Weygand, D., Annu. Rev. Mater. Res. 40, 293 (2010).Google Scholar
Legros, M., in Mechanics of Nano-Objects, Thomas, O., Ponchet, A., Forest, S., Eds. (Presse des Mines, Paris, 2011) p. 241.Google Scholar
Shan, Z.W., Adesso, G., Cabot, A., Sherburne, M.P., Asif, S.A.S., Warren, O.L., Chrzan, D.C., Minor, A.M., Alivisatos, A.P., Nat. Mater. 7, 947 (2008).Google Scholar
Legros, M., C.R. Phys. 15, 224 (2014).Google Scholar
Couret, A., Crestou, J., Farenc, S., Molenat, G., Clément, N., Coujou, A., Caillard, D., Microsc. Microanal. Microstruct. 4, 153 (1993).Google Scholar
Castany, P., Legros, M., Mater. Sci. Eng. A 528, 1367 (2011).Google Scholar
Pant, B., Allen, B.L., Zhu, T., Gall, K., Pierron, O.N., Appl. Phys. Lett. 98, 053506 (2011).Google Scholar
Mompiou, F., Legros, M., Boé, A., Coulombier, M., Raskin, J.-P., Pardoen, T., Acta Mater. 61, 205 (2013).Google Scholar
Gianola, D.S., Van Petegem, S., Legros, M., Brandstetter, S., Van Swygenhoven, H., Hemker, K.J., Acta Mater. 54, 2253 (2006).Google Scholar
Molenat, G., Caillard, D., Philos. Mag. A 64, 1291 (1991).CrossRefGoogle Scholar
Guo, H., Yan, P.F., Wang, Y.B., Tan, J., Zhang, Z.F., Sui, M.L., Ma, E., Nat. Mater. 6, 735 (2007).Google Scholar
M, Ian. Robertson Research Group, Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, April 2009, visited on September 2013, robertson.matse.illinois.edu.Google Scholar
Pelissier, J., Debrenne, P., Microsc. Microanal. Microstruct. 4, 111 (1993).Google Scholar
Legros, M., Cabié, M., Gianola, D.S., Microsc. Res. Tech. 72, 270 (2009).CrossRefGoogle Scholar
Kubin, L.P., Lépinoux, J., Rabier, J., Veyssière, P., Fourdeux, A., Proceedings of the 6th International Conference on the Strength of Metals and Alloys (ICSMA 6), Gikins, G., Ed. (Pergamon, Oxford, UK, 1982), vol. 2, pp. 953–957.CrossRefGoogle Scholar
Lepinoux, J., Kubin, L.P., Philos. Mag. A 51, 675 (1985).Google Scholar
Messerschmidt, U., Dislocation Dynamics during Plastic Deformation (Springer, Berlin, 2010).Google Scholar
Legros, M., Hemker, K.J., Gouldstone, A., Suresh, S., Keller-Flaig, R.M., Arzt, E., Acta Mater. 50, 3435 (2002).Google Scholar
Legros, M., Dehm, G., Arzt, E., Balk, T.J., Science 319, 1646 (2008).Google Scholar
Tsui, T.Y., Oliver, W.C., Pharr, G.M., J. Mater. Res. 11, 752 (2011).Google Scholar
Oliver, W.C., Pharr, G.M., J. Mater. Res. 7, 1564 (1992).CrossRefGoogle Scholar
Pethica, J.B., Hutchings, R., Oliver, W.C., Philos. Mag. A 48, 593 (1983).Google Scholar
Loubet, J.L., Georges, J.M., Marchesini, O., Meille, G., J. Lubr. Technol. 106, 43 (1984).Google Scholar
Ohnishi, H., Kondo, Y., Takayanagi, K., Nat. Commun. 395, 780 (1998).Google Scholar
Kizuka, T., Phys. Rev. B: Condens. Matter 57, 11158 (1998).Google Scholar
Kizuka, T., Yamada, K., Tanaka, N., Appl. Phys. Lett. 70, 964 (1997).Google Scholar
Poncharal, P., Wang, Z.L., Ugarte, D., de Heer, W.A., Science 283, 1513 (1999).Google Scholar
Wang, Z.L., Poncharal, P., de Heer, W.A., J. Phys. Chem. Solids 61, 1025 (2000).Google Scholar
Stach, E.A., Freeman, T., Minor, A.M., Owen, D.K., Cumings, J., Wall, M.A., Chraska, T., Hull, R., Morris, J.W. Jr., Zettl, A., Microsc. Microanal. 7, 507 (2001).CrossRefGoogle Scholar
Jin, M., Minor, A.M., Stach, E.A., Morris, J.W. Jr., Acta Mater. 52, 5381 (2004).Google Scholar
Lockwood, A.J., Inkson, B.J., J. Phys. D: Appl. Phys. 42, 035410 (2008).CrossRefGoogle Scholar
Bobji, M.S., Ramanujan, C.S., Pethica, J.B., Inkson, B.J., Meas. Sci. Technol. 17, 1324 (2006).Google Scholar
Wall, M.A., Dahmen, U., Microsc. Res. Tech. 42, 248 (1998).Google Scholar
Minor, A.M., Morris, J.W., Stach, E.A., Appl. Phys. Lett. 79, 1625 (2001).Google Scholar
Minor, A.M., Lilleodden, E.T., Stach, E.A., Morris, J.W., J. Mater. Res. 19, 176 (2004).Google Scholar
Minor, A.M., Lilleodden, E.T., Jin, M., Stach, E.A., Chrzan, D.C., Morris, J.W., Philos. Mag. 85, 323 (2005).Google Scholar
Gianola, D.S., Eberl, C., JOM 61, 24 (2009).Google Scholar
Minor, A.M., Syed Asif, S.A., Shan, Z., Stach, E.A., Cyrankowski, E., Wyrobek, T.J., Warren, O.L., Nat. Mater. 5, 697 (2006).Google Scholar
Nafari, A., Danilov, A., Rödjegård, H., Enoksson, P., Olin, H., in Eurosensors XVIII 2004: The 18th European Conference on Solid-State Transducers, French, P.J., Ed. (Elsevier, Amsterdam, 2005), vols. 123–124, pp. 44–49.Google Scholar
Casillas, G., Ponce, A., Velázquez-Salazar, J.J., José-Yacamán, M., Nanoscale 5, 6333 (2013).Google Scholar
Minor, A.M., Morris, J.W., Stach, E.A., Appl. Phys. Lett. 79, 1625 (2001).Google Scholar
Uchic, M.D., Dimiduk, D.M., Florando, J.N., Nix, W.D., Science 305, 986 (2004).Google Scholar
Kiener, D., Minor, A.M., Acta Mater. 59, 1328 (2011).Google Scholar
Shan, Z.W., Mishra, R.K., Asif, S.A.S., Warren, O.L., Minor, A.M., Nat. Mater. 7, 115 (2008).Google Scholar
Calvié, E., Joly-Pottuz, L., Esnouf, C., Clément, P., Garnier, V., Chevalier, J., Jorand, Y., Malchère, A., Epicier, T., Masenelli-Varlot, K., J. Eur. Ceram. Soc. 32, 2067 (2012).Google Scholar
Deneen, J., Mook, W.M., Minor, A., Gerberich, W.W., Carter, C.B., J. Mater. Sci. 41, 4477 (2006).Google Scholar
De Knoop, L., Legros, M., Scr. Mater. 74, 44 (2014).Google Scholar
Lu, Y., Ganesan, Y., Lou, J., Exp. Mech. 50, 47 (2009).Google Scholar
Lu, Y., Peng, C., Ganesan, Y., Huang, J.Y., Lou, J., Nanotechnology 22, 355702 (2011).Google Scholar
Guo, H., Chen, K., Oh, Y., Wang, K., Dejoie, C., Syed Asif, S.A., Warren, O.L., Shan, Z.W., Wu, J., Minor, A.M., Nano Lett. 11, 3207 (2011).CrossRefGoogle Scholar
Sharon, J.A., Zhang, Y., Mompiou, F., Legros, M., Hemker, K.J., Scr. Mater. 75, 10 (2013).Google Scholar
Han, J.H., Saif, M.T.A., Rev. Sci. Instrum. 77, 045102 (2006).Google Scholar
Haque, M.A., Saif, M.T.A., Exp. Mech. 42, 123 (2002).Google Scholar
Espinosa, H.D., Bernal, R.A., Filleter, T., Small 8, 3233 (2012).Google Scholar
Zhu, Y., Espinosa, H.D., Proc. Natl. Acad. Sci. U.S.A. 102, 14503 (2005).Google Scholar
Espinosa, H.D., Zhu, Y., Moldovan, N., J. Microelectromech. Syst. 16, 1219 (2007).Google Scholar
Ishida, T., Nakajima, Y., Kakushima, K., Mita, M., Toshiyoshi, H., Fujita, H., J. Micromech. Microeng. 20, 075011 (2010).Google Scholar
Sato, T., Ishida, T., Jalabert, L., Fujita, H., Nanotechnology 23, 505701 (2012).Google Scholar
Sato, T., Jalabert, L., Fujita, H., Microelectron. Eng. 112, 269 (2013).Google Scholar
Hall, E.O., Proc. Phys. Soc. Lond. B 64, 747 (1951).Google Scholar
Petch, N.J., J. Iron Steel Inst. 174, 25 (1953).Google Scholar
Nieh, T.G., Wadsworth, J., Scr. Metall. Mater. 25, 955 (1991).Google Scholar
Mompiou, F., Caillard, D., Legros, M., Mughrabi, H., Acta Mater. 60, 3402 (2012).Google Scholar
Robertson, I.M., Ferreira, P.J., Dehm, G., Hull, R., Stach, E.A., MRS Bull. 33, 122 (2008).Google Scholar
Zghal, S., Coujou, A., Couret, A., Solid State Phenom. 59–60, 165 (1998).Google Scholar
Hsiung, L.M., Schwartz, A.J., Nieh, T.G., Scr. Mater. 36, 1017 (1997).Google Scholar
Kwiecinski, J., Wyrzykowski, J.W., Acta Metall. Mater. 39, 1953 (1991).Google Scholar
Biyikli, E., Canadinc, D., Maier, H.J., Niendorf, T., Top, S., Mater. Sci. Eng. A 527, 5604 (2010).Google Scholar
Ohmura, T., Minor, A.M., Stach, E.A., Morris, J.W., J. Mater. Res. 19, 3626 (2004).Google Scholar
Kacher, J.P., Liu, G.S., Robertson, I.M., Scr. Mater. 64, 677 (2011).Google Scholar
Chassagne, M., Legros, M., Rodney, D., Acta Mater. 59, 1456 (2011).Google Scholar
Hosson, J.T.M., Soer, W.A., Minor, A.M., Shan, Z., Stach, E.A., Syed Asif, S.A., Warren, O.L., J. Mater. Sci. 41, 7704 (2006).Google Scholar
Meyers, M.A., Mishra, A., Benson, D.J., Prog. Mater. Sci. 51, 427 (2006).Google Scholar
Rupert, T.J., Gianola, D.S., Gan, Y., Hemker, K.J., Science 326, 1686 (2009).Google Scholar
Legros, M., Gianola, S.D., Hemker, K.J., Acta Mater. 56, 3380 (2008).Google Scholar
Mompiou, F., Legros, M., Caillard, D., J. Mater. Sci. 46, 4308 (2011).Google Scholar
Cahn, J.W., Mishin, Y., Suzuki, A., Acta Mater. 54, 4953 (2006).Google Scholar
Rae, C.M.F., Smith, D.A., Philos. Mag. A 41, 477 (1980).Google Scholar
Rajabzadeh, A., Legros, M., Combe, N., Mompiou, F., Molodov, D.A., Philos. Mag. 93, 1299 (2013).Google Scholar
Rajabzadeh, A., Mompiou, F., Legros, M., Combe, N., Phys. Rev. Lett. 110, 265507 (2013).Google Scholar
Rajabzadeh, A., Mompiou, F., Lartigue-Korinek, S., Combe, N., Legros, M., Molodov, D.A., Acta Mater. 77, 223 (2014).Google Scholar
Mompiou, F., Legros, M., Radetic, T., Dahmen, U., Gianola, D.S., Hemker, K.J., Acta Mater. 60, 2209 (2012).Google Scholar
Wang, L., Teng, J., Liu, P., Hirata, A., Ma, E., Zhang, Z., Nat. Commun. 5, 4402 (2014).Google Scholar
Yu, Q., Sun, J., Morris, J.W. Jr., Minor, A.M., Scr. Mater. 69, 57 (2013).Google Scholar
Shan, Z.W., Mishra, R.K., Syed Asif, S.A., Warren, O.L., Minor, A.M., Nat. Mater. 7, 115 (2008).Google Scholar
Kiener, D., Minor, A.M., Nano Lett. 11, 3816 (2011).Google Scholar
Oh, S.H., Legros, M., Kiener, D., Dehm, G., Nat. Mater. 8, 95 (2009).Google Scholar
Yu, Q., Qi, L., Mishra, R.K., Li, J., Minor, A.M., Proc. Natl. Acad. Sci. U.S.A. 110, 13289 (2013).Google Scholar
Kraft, O., Nat. Mater. 9, 295 (2010).Google Scholar
Yu, Q., Qi, L., Chen, K., Mishra, R.K., Li, J., Minor, A.M., Nano Lett. 12, 887 (2012).Google Scholar
Ye, J., Mishra, R.K., Sachdev, A.K., Minor, A.M., Scr. Mater. 64, 292 (2011).Google Scholar
Liu, B.-Y., Wang, J., Li, B., Lu, L., Zhang, X.-Y., Shan, Z.-W., Li, J., Jia, C.-L., Sun, J., Ma, E., Nat. Commun. 5, 3297 (2014).Google Scholar
Ye, J., Mishra, R.K., Pelton, A.R., Minor, A.M., Acta Mater. 58, 490 (2010).Google Scholar
Guo, H., Wang, K., Deng, Y., Oh, Y., Syed Asif, S.A., Warren, O.L., Shan, Z.W., Wu, J., Minor, A.M., Appl. Phys. Lett. 102, 231909 (2013).Google Scholar
Zhong, L., Wang, J., Sheng, H., Zhang, Z., Mao, S.X., Nat. Commun. 512, 177 (2014).Google Scholar
Zheng, K., Wang, C., Cheng, Y.-Q., Yue, Y., Han, X., Zhang, Z., Shan, Z., Mao, S.X., Ye, M., Yin, Y., Ma, E., Nat. Commun. 1, 24 (2010).Google Scholar
Hÿtch, M.J., Minor, A.M., MRS Bull. 39, 138 (2014).CrossRefGoogle Scholar
Rauch, E.F., Veron, M., Portillo, J., Bultreys, D., Maniette, Y., Nicolopoulos, S., Microsc. Anal. 93, S5 (2008).Google Scholar
Stach, E.A., Zakharov, D., Rivas, R.D., Longo, P., Lent, M., Gubbens, A., Czarnik, C., Microsc. Microanal. 19, 392 (2013).Google Scholar
Ozdol, V.B., Gammer, C., Sarahan, M.C., Minor, A.M., Microsc. Microanal. 20, 1046 (2014).Google Scholar
LaGrange, T., Campbell, G.H., Reed, B.W., Taheri, M., Pesavento, J.B., Kim, J.S., Browning, N.D., Ultramicroscopy 108, 1441 (2008).Google Scholar