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Comments on “Synthesis and structural characterization of rutile SnO2 nanocrystals” by Z. Chen, J.K.L. Lai, C.H. Shek, and H. Chen [J. Mater. Res. 18, 1289 (2003)]

Published online by Cambridge University Press:  03 March 2011

R. Dolbec ,
M.A. El Khakani ,
A.M. Serventi  and
R.G. Saint-Jacques
R. Dolbec
Affiliation:
INRS-Énergie, Matériaux et Télécommunications, 1650 Blvd. Lionel-Boulet, C.P. 1020, Varennes, Québec, Canada J3X 1S2
M.A. El Khakani*
Affiliation:
INRS-Énergie, Matériaux et Télécommunications, 1650 Blvd. Lionel-Boulet, C.P. 1020, Varennes, Québec, Canada J3X 1S2
A.M. Serventi
Affiliation:
INRS-Énergie, Matériaux et Télécommunications, 1650 Blvd. Lionel-Boulet, C.P. 1020, Varennes, Québec, Canada J3X 1S2
R.G. Saint-Jacques
Affiliation:
INRS-Énergie, Matériaux et Télécommunications, 1650 Blvd. Lionel-Boulet, C.P. 1020, Varennes, Québec, Canada J3X 1S2
*
a)Address all correspondence to this author. e-mail: elkhakan@inrs-emt.uquebec.ca
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Abstract

The nanostructure, stoichiometry and sensing performance of SnO2 films grown by pulsed laser deposition (PLD) have been shown to be highly sensitive to the deposition conditions. In particular, PLD deposition under vacuum is known to produce films that are composed of both a polycrystalline SnO2 phase and an amorphous SnO phase, for deposition temperatures in the 20–600 °C range. The presence of such an amorphous SnO phase in the films greatly limits their practical use as gas-sensing devices.

Keywords

Laser ablationX-ray diffraction (XRD)Gas sensors

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Journal of Materials Research , Volume 19 , Issue 4 , April 2004 , pp. 1290 - 1292
Copyright
Copyright © Materials Research Society 2004

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References

Comments on papers previously published in Journal of Materials Research and replies from the author of the original paper are published together in this section.