Hostname: page-component-7dd5485656-frp75 Total loading time: 0 Render date: 2025-10-31T02:23:12.500Z Has data issue: false hasContentIssue false
  • English
  • Français

F-46 Bench Top X-ray Fluorescence Spectrometers based on Orthogonal and Total Reflection Geometry for Excitation

Published online by Cambridge University Press:  20 May 2016

R. E. Ayala Jiménez
R. E. Ayala Jiménez
Affiliation:
Fisichem, Miami, FL
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'

Information

Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 19 , Issue 2 , June 2004 , pp. 194
Copyright
Copyright © Cambridge University Press 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable