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Microstructure and electrical properties of 0.5PZN-0.5PZT relaxor ferroelectrics close to the morphotropic phase boundary

Published online by Cambridge University Press:  31 January 2011

Lu-Yang Zhao ,
Yu-Dong Hou ,
Li-Min Chang ,
Man-Kang Zhu  and
Hui Yan
Yu-Dong Hou*
Affiliation:
Department of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
Hui Yan
Affiliation:
Department of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
*
a) Address all correspondence to this author. e-mail: ydhou@bjut.edu.cn
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Abstract

Relaxor ferroelectrics of Pb(Zn1/3Nb2/3)0.5(Zr0.47Ti0.53)0.5O3 (0.5PZN-0.5PZT) were prepared using the conventional oxide mixing method. Both x-ray diffraction analysis and Raman spectroscopy indicate that the amounts of rhombohedral phase are close to tetragonal phase, implying the presence of the morphotropic phase boundary (MPB) in the system of 0.5PZN-0.5PZT, and this result was further confirmed by transmission electron microscopy (TEM) micrographs. At MPB composition, the excellent piezoelectric properties, such as kp (0.66) and d33 (425pC/N), were obtained due to the more possible polarization directions of domains and high dc resistivity of 6.5 × 1010 Ω·cm. Meanwhile, the dielectric studies revealed that the indicator of the degree of diffuseness γ value is 1.73, implying that the relaxor nature of the 0.5PZN-0.5PZT is ceramic. The activation energy related to the dc conductivity was estimated from a linear fitting of the Arrhenius law. The value of 0.09 and 1.04 eV for low and high temperature range corresponds well to the activation energies of migration and first ionization of the oxygen vacancies.

Keywords

CeramicDielectric propertiesFerroelectric

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Type
Articles
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Journal of Materials Research , Volume 24 , Issue 6 , June 2009 , pp. 2029 - 2034
Copyright
Copyright © Materials Research Society 2009

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